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On-Demand CNC Platform

CNC Machining for
Metrology
Equipment

We machine inspection stage plates, optical bench mounts, probe card holders, and calibration fixtures from aluminum, stainless, and Invar with ultra-flat, deburr-free finishes. Ships anywhere in the US.

Securely upload your 3D CAD file for immediate pricing and DFM feedback.

$14B+
Global semiconductor
metrology market
Market Research 2024
<Ra 16
Microinch finish on
reference surfaces
RivCut capability
±0.0005"
Positional tolerance on
mounting features
RivCut capability
5-Day
Prototype turnaround
available
Standard lead time

Ultra-Precision CNC Machining for Metrology

Semiconductor metrology and inspection equipment measures wafer features at the nanometer scale. The mechanical components that position wafers, hold optics, and mount sensors must deliver sub-micron positional repeatability with ultra-flat reference surfaces and thermally stable mounting platforms. A warped stage plate or an out-of-position dowel pin hole can shift optical alignment and corrupt measurement data across an entire wafer lot. We machine aluminum 6061-T6, 316L stainless steel, Invar 36, and sapphire-interfacing fixtures to tolerances as tight as ±0.0005" with surface finishes below Ra 16 microinches on all datum and reference surfaces.

1

Thermally Stable Materials

We machine Invar 36, Super Invar, and aluminum 6061-T6 for optical bench mounts and inspection stages. Invar's ultra-low CTE is critical for maintaining alignment under temperature drift.

2

Ultra-Flat Reference Surfaces

We hold flatness within 0.0002" per linear inch on stage reference surfaces and datum planes. Positional accuracy on dowel pin holes within ±0.0005" for kinematic mount repeatability.

3

Full Inspection Documentation

Every metrology component ships with CMM inspection reports, material certs, and surface finish verification. Full traceability for your equipment qualification process.

Parts for Metrology Equipment

Inspection stages, optical mounts, probe card holders, and more — machined ultra-flat and deburr-free.

Inspection Stage Plates

XY and theta stage plates machined from aluminum 6061-T6 and Invar 36 with ultra-flat reference surfaces, precision dowel pin holes, and linear rail mounting interfaces. Flatness within 0.0002" per inch.

Invar 36 & aluminum

Wafer Chuck Inserts

Vacuum chuck inserts machined from aluminum and SiC-compatible ceramics with precision vacuum groove patterns, lift pin clearance holes, and ultra-flat wafer contact surfaces finished below Ra 16 microinches.

<Ra 16µin surface

Optical Bench Mounts

Kinematic and semi-kinematic optical bench mounts machined from Invar 36 and Super Invar. Precision V-groove seats, spherical locating pockets, and dowel pin interfaces for repeatable lens and mirror positioning.

Super Invar available

Probe Card Holders

Probe card holder frames machined from aluminum 6061-T6 and stainless steel with precision guide pin locations, card retention features, and alignment datums. Pin positional accuracy within ±0.0005".

±0.0005" pin locations

Calibration Fixtures

Step-height standards, pitch calibration fixtures, and alignment verification tools machined from hardened tool steel and stainless steel. Reference surfaces ground and lapped for sub-microinch flatness.

CMM-verified

Reference Blocks

Flatness and parallelism reference blocks machined from tool steel and 316L stainless with opposing surfaces ground parallel within 0.0001". Used to calibrate metrology equipment and validate measurement systems.

0.0001" parallelism

Serving the Metrology Equipment Industry

Semiconductor fabs rely on metrology and inspection tools at nearly every process step — measuring critical dimensions, overlay alignment, film thickness, and defect density. As chip geometries shrink below 3nm, the mechanical precision demanded from inspection stages, optical mounts, and probe card holders increases exponentially.

Equipment OEMs and integrators need machine shops that understand kinematic mounting, thermal stability requirements, and the ultra-flat reference surfaces that ensure measurement accuracy at the nanometer scale.

We machine metrology equipment components for tool builders across the US. Instant AI pricing the moment you upload your file.

Applied Materials

The world's largest semiconductor equipment maker builds inspection and process control systems requiring precision-machined optical bench mounts and wafer positioning stages.

Lam Research

Leading etch and deposition equipment maker whose tools integrate endpoint detection and metrology subsystems requiring precision-machined sensor mounting components.

KLA Corporation

The dominant player in semiconductor process control and inspection. KLA's wafer inspection, review, and metrology tools rely on ultra-precision mechanical stages and optical mounts.

ASML

EUV and DUV lithography systems incorporate extensive metrology subsystems for alignment and overlay measurement, requiring thermally stable mounts machined from Invar and Super Invar.

Tokyo Electron (TEL)

Major coater/developer and etch OEM whose platforms incorporate inline metrology modules requiring precision wafer positioning stages and calibration fixtures.

Built for Metrology Teams

Metrology parts demand a shop that understands positional accuracy as well as surface flatness.

Ultra-Flat Reference Surfaces

We hold flatness within 0.0002" per linear inch on stage plates and reference surfaces. Datum planes are verified on our CMM before any part ships. No warps, no waviness, no guesswork.

Full Material Traceability

Every order ships with mill certs and heat lot numbers. Complete traceability from raw Invar, aluminum, or stainless billet to finished metrology component for your equipment qualification.

CMM Inspection on Every Order

We verify every critical dimension before shipping — flatness, parallelism, positional accuracy of dowel pin holes, and surface finish. Inspection reports go with every part.

Fast Prototype Turnaround

Your metrology tool development schedule does not wait. Inspection stage and optical mount prototypes in 5 to 7 days so your program keeps moving. Rush available on simple geometries.

Certifications & Standards
In Progress
ISO 9001
Quality management system certification. We are building our QMS to this standard. Our documentation follows the structure now.
Active
NIST-Traceable Gauges
All measuring equipment is calibrated to NIST standards on regular cycles. CMM, micrometers, and surface finish gauges.
Active
Material Certifications
Every order ships with mill certs and heat lot traceability. Records kept for your audit trail and equipment qualification.
Planned
Cleanroom Compatibility
Cleanroom-compatible packaging and cleaning protocols on our roadmap. Currently offer double-bagging and oil-free cleaning on request.

Questions about our current quality setup? Email us — we'll send our documentation package.

From File to Part in 3 Steps

Simple, clear, and designed for fast-moving metrology equipment teams.

Step 1

Upload & Quote

Send your STEP or IGES file. Pick your material, quantity, and finish. Our AI gives you a real price right away. We also run a free DFM check and flag anything that could affect measurement accuracy.

Step 2

We Machine & Inspect

Your parts run on our CNC mills and lathes. Every order gets CMM inspection. We verify flatness, positional accuracy of mounting features, and surface finish on every metrology component.

Step 3

Ship with Full Docs

Parts ship with dimensional inspection reports, material certs, and surface finish verification. Everything your quality team needs for metrology equipment qualification and tool validation.

Questions from Metrology Teams

We machine aluminum 6061-T6, 316L stainless steel, Invar 36, and Super Invar for semiconductor metrology components. Invar is commonly specified for optical bench mounts and inspection stages due to its ultra-low coefficient of thermal expansion. All materials sourced with full mill certs.
We hold positional tolerances of ±0.0005 inches on mounting features and flatness within 0.0002 inches per linear inch on inspection stage reference surfaces. These tolerances ensure accurate wafer positioning during optical and electron-beam inspection.
Yes. We machine Invar 36 and Super Invar optical bench mounts with precision dowel pin holes, kinematic mounting interfaces, and ultra-flat reference surfaces. Invar's low thermal expansion is critical for maintaining optical alignment in metrology tools.
We achieve surface finishes below Ra 16 microinches on reference datum surfaces and below Ra 8 microinches on optical mounting interfaces. All surfaces are deburred and free of tool marks that could affect measurement accuracy.
Yes. We machine probe card holders from aluminum 6061-T6 and stainless steel with precision pin locations, card retention features, and alignment datums. Positional accuracy on pin holes is within ±0.0005 inches.
Yes. We machine step-height calibration standards, flatness reference blocks, and pitch calibration fixtures from hardened tool steel, stainless steel, and aluminum. All reference surfaces are verified with CMM inspection before shipping.
Yes. We machine wafer chuck inserts from aluminum and SiC-compatible materials with precision vacuum groove patterns, lift pin holes, and ultra-flat wafer contact surfaces. Vacuum channels are fully deburred to prevent particle generation.
Most metrology component prototypes ship in 5 to 7 business days. Rush orders on simpler geometries can ship in 3 to 4 days. Tell us your deadline when you upload and we will confirm feasibility.

Metrology CNC Machining by City

We serve semiconductor metrology teams in cities across the US.

Upload Your Metrology CAD File

Inspection stages, optical bench mounts, probe card holders, calibration fixtures — we machine them all with ultra-flat, deburr-free finishes. Get instant AI pricing now.

No minimums · 100% Made in USA · Never brokered · Ships anywhere in the US

AI price estimates are usually within ±20% of final price. Complex parts may get a human review within one business day before pricing is confirmed.

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